Future ATE for System on a Chip... Some Perspectives
Published 02-Oct-2003
Abstract
The ATE industry will increasingly be channged (1) to support heterogeneous SOCs with changing test methodologies, (2) to enable lowest cost of test, (3) to support and complement DFT and BIST, (4) and to fully utilize information from design and valuable information from production for correlation-based test, diagnostics and yield improvement.
Abstract
The ATE industry will increasingly be channged (1) to support heterogeneous SOCs with changing test methodologies, (2) to enable lowest cost of test, (3) to support and complement DFT and BIST, (4) and to fully utilize information from design and valuable information from production for correlation-based test, diagnostics and yield improvement.
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