Optimizing the Time-Quality-Cost Equation, SEMI EMTC 2006
Published 4-Apr-2006
Abstract
Uses DFT approach to demonstrate the ability to reduce time to debug, improve test time and multi-site efficiency, achieve target quality levels and significantly lower test platform costs.
Abstract
Uses DFT approach to demonstrate the ability to reduce time to debug, improve test time and multi-site efficiency, achieve target quality levels and significantly lower test platform costs.
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