Published 01-Jun-2001

Abstract
Continuous progress in semiconductor processes and integration technologies is the base for growth in microelectronics. A cross-industry initiative is needed to drive an evolution that makes test scale with this progress in all aspects of cost, throughput, complexity and performance. This paper describes a set of steps to a DFT centric test paradigm, some of which are ready for industry wide deployment, others are the focus of research in universities and industry.