| The Test Technology Resource Center makes it easy for you to find test methodologies, technical notes, Q&As prepared by our Application Engineers and access to the Test Technology Library, which contains over 70 valuable technical papers. |
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| Test Technology Library |
Test Methodologies | ||||||||||
| Accurate Harmonics Measurement by Sampler: Part 1 This paper introduces the measurement conditions and the method to measure the correct harmonic distortions by the Sampler based on experiments. Auto-Z Test Cell Software Solution This paper explains the needs and benefits to the industry of the Auto Z solution and the structure of the current solution on the V93000 with TEL prober, and how it operates. View all Test Technology Library papers |
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 44: Analog Signal Generation by Digital Pin Driver I This article discusses how to generate a good enough sinusoid with minimum external components by using a digital pin driver. Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 43: Jitter Estimation from Phase Noise Data This article discusses how to estimate jitter from phase noise data. Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 42: Jitter Calculation by Spectrum Test/application engineers in the mixed signal field should have thorough knowledge about DSP-based testing. FFT (Fast Fourier Transform) is the most powerful tool here. Continuing from last month, this article will deliver a series of fundamental knowledge of DSP-based testing, especially FFT and its related topics. View all Test Methodologies |
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| Technical Notes |
Q&A | ||||||||||
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Challenges of Correlating Phase Noise with RMS and Random Jitter GSM/EDGE Output RF Spectrum on the V93000 A Novel Dynamic Method to Generate PRBS Pattern View all Technical Notes |
How do you execute GDDR5 device training during a shmoo run? Question: "What is a best way to measure pulse width of DisplayPort transmitter with V93000 PS3600?" View all Q&As |
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