Revolutionary technology enables 4x performance, increased throughput and yield through massive parallelism and significantly improved signal fidelity

With the V6000 test solutions, Advantest introduces Active Matrix™, the innovative patent-pending technology that enables increased throughput through increased parallelism, and increased yield through significantly improved signal fidelity.

Thanks to Active Matrix, the V6000 can deliver the breakthrough cost-of-test, scalability and flexibility you need to enable long functional life for both Flash and DRAM testing. Increased performance equals higher speeds and increased signal fidelity, resulting in reduced test time and higher yields. Fully integrated into the tester, Active Matrix delivers:

• 18k I/O pins
• 4k programmable power supplies
• Minimum cable length connecting to pin electronics

The Active Matrix provides what no other test solution on the market can:

Four times the number of pins = four times the parallelism at half the cost per pin

• Pin electronics are moved to the interface layer, located in a cost-optimized pin electronics ASIC to achieve up to 18K pins per system
• Custom ASICs, with drivers and comparators, produce four times the parallelism of traditional test solutions, at significantly lower costs (50 percent less per pin)
• Matches or exceeds the parallelism of other testers, without the signal degradation caused by sharing pins or the yield loss caused by shorted pins on a shared channel

75 percent reduction in distance between the pin electronics and probe card improves signal fidelity and yield

• Active Matrix ASIC enables close proximity to the probe card to provide optimal signal performance and parallel reads
• Reduced capacitive load-to-drive helps to eliminate excessive guard banding caused by long tester transmission lines that don't match real-world device environments