Verigy redefines the industry with the revolutionary V6000. Through its patent-pending Active Matrix™ and sixth-generation Tester-Per-Site® architecture, the V6000 delivers breakthrough cost-of-test, parallelism and yield for engineering, wafer sort and final test of both Flash and DRAM. The versatility of the V6000 allows testing of Flash and DRAM on the same test solution. The V6000 is scalable over time to greatly extend the useful life of your capital investment.

V6000e
The V6000e is the industry's first engineering test solution for Flash and DRAM applications for the office and lab environment.

V6000 WS
The industry's first wafer sort test solution for Flash and DRAM applications, delivering versatility, scalability and breakthrough cost-of-test - at the lower price of a Flash tester.

V6000 Platform
Same architecture, software and hardware enables flexibility, scalability and extends tester life.

Active Matrix
Revolutionary technology enables increased throughput and yield through massive parallelism and significantly improved signal fidelity.

V5500
Provides a cost-effective solution for single insertion testing of complex multi-chip packaged devices (MCPs) and discrete Flash at up to 768 devices in parallel.

V5400
The V5400 provides cost-effective test for Flash memory as well as a wide mix of other memory devices including DRAM, SRAM and BIST-enabled devices.

V5000ep
The Verigy V5000ep delivers characterization, quality assurance, small lot production and final test capabilities in an affordable configuration. The solution bridges the gap between a high volume production tester and an engineering workstation.

V5000e
The V5000e brings the V5400's power and versatility to your office environment.

Tester-Per-Site® Architecture
Utilizes a multi-site controller and multiple APGs that are dynamically configurable to match specific applications and device types.