The New Standard for Testing the Latest 3G, High-integration RF Devices
The Port Scale RF solution provides highest test efficiency and minimum cost-of-test, with up to 48 ports, true quad-site and high multi-site parallel efficiency.
Verigy's Port Scale RF Solution is designed for semiconductor fabless design companies, integrated device manufacturers, and outsourced semiconductor assembly and test companies.
It satisfies the need for cost-effective, reliable ATE RF stimuli and measurement testing of:
The 100% solid-state design places all RF resources in the test head, which takes advantage of the stability, reliability and repeatability inherent to the V93000 architecture. With up to 48 RF ports, true quad-site and high multi-site parallel efficiency, it addresses the port counts required by high integration devices while achieving the lowest cost-of-test through highest test efficiency - all integrated into the test head itself. It meets increasing performance, yield and economic demands, without sacrificing measurement quality or throughput.
Port Scale RF Introduction 
Background Information
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Technical Specifications
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| Up to 48 ports | Enables testing of highly-integrated devices | |
| True quad-site and multi-site parallel efficiency | Lower cost-of-test | |
| Proven V93000 stability, reliability and repeatability, with RF now fully integrated into the test head | Improved OEE with higher uptime (better MTBF, MTTR). Achieve high RF performance and test with confidence. | |
| Robust and accurate docking for probe and final test | Robust, stable manufacturing readiness with increased system availability | |
| Integrated analog and RF test setup | Faster time-to-market | |
| Integrated test flow with step-by-step debug tools | Lower test development time | |
| Powerful sequencer control of RF and mixed signal resources | Optimal throughput time and precise control of tester resources | |
| "Active Hardware" screen view | Fast, intuitive development | |
| "One-click" intelligent calibration, Eclipse software environment with perspectives, and GUI-based setups exporting to test method templates | Fast test development with no test plan calibration required during most of test development phase | |
| Higher levels of hardware integration (Integrated digital/analog/RF synchronization, MB AV8 analog card plus digital cards all together, even in Compact Test Head) | Lower capital cost by reducing required investment; no support rack needed | |
| No gold bricks-solid state attenuators and switches | Better stability, repeatability and reliability (less real estate to cool). Much higher level of resource integration; more functionality/square inch resulting in smaller tester and down to zero footprint | |
| 12, 24 and up to 48 RF ports | Increased scalability with very low cost to upgrade to additional ports | |
| Compatible with existing V93000 RF solutions (Griffin) including hardware/software architecture and migration tools | Easy and lowest-cost transition | |
| Lowest noise floor (down to -161 dBm/Hz) and LNA (Low Noise Amplifier) input with sensitivity | Less required averaging resulting in optimum throughput and highly accurate measurements | |
| Multi-tone stimulus, fast switching (50 µs) and source operations (<1ms) | Highest throughput |
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| RF Source Frequency | 10 MHz to 6 GHz | |
| RF Measure Frequency | 50 MHz to 8 GHz | |
| RF Source Power Level - Min RF Source Power Level - Max (Port Dependent) |
-110 dBm to 6 GHz +10 dBm to 6 GHz source only card +6 dBM to 6 GHz source/measure card |
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| RF Measure Power Level-Max | +20 dBm | |
| Noise Floor (based on typical performance) |
Coupled Path: <-121 dBm/Hz to 6 GHz Scalar Path: <-133 dBm/Hz to 6 GHz LNA Path: <-161 dBm/HZ to 6 GHz |
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| Source Phase Noise (Fc=1.9 GHz) |
119 dBc/Hz @ 10 kHz offset -144 dBc/Hz @ 1 MHz offset -151 dBc/Hz @ 10 MHz offset |
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| IF bandwidth | 0.08 Hz to 40 MHz |