The V93000 platform is designed to test cost-sensitive as well as complex and sophisticated System-on-a-Chip (SOC) and System-in-a-Package (SIP) devices. It’s Test Processor-Per-Pin architecture enables independent testing of each device pin while its design enables rapid configuration changes making it well suited for testing a wide range of products.

Digital
Digital speeds from 100 Mbps to 12.8 Gbps, with multiple price/performance points along the way, cover the widest range of applications at the price you need to remain competitive.

Analog
Full application coverage with comprehensive analog offering.

RF
Solutions provide high-performance RF capabilities, test efficiencies, low cost-of-test and throughput for emerging high integration devices and/or low integration RF transceivers.

MS-DPS
Next generation, low COT DPS solution doubles multi-site capability for mixed signal applications

V93000 Infrastructure/Platform
Right architecture to meet current and future complex SoC/SIP test challenges.