The V93000 Consumer Mixed Signal Test Solution is the best way to achieve low cost-of-test while accurately overcoming the unique mixed signal testing challenges of the latest consumer device SOCs.
The V93000 Consumer Mixed Signal Test Solution is tailored for semiconductor designers and high volume manufacturers who need to effectively and economically perform mixed signal tests across a broad range of highly integrated consumer applications, such as:
Using the most advanced test methods to ensure the highest accuracy and test quality, the solution achieves high single-site and multi-site throughput in both wafer sort and final test of highly integrated devices.
Other systems available in this space require multiple platforms and solutions, and sacrifice functionality to address value and cost requirements. In contrast, the V93000 Consumer Mixed Signal test solution leverages a single, scalable platform with proven stability, reliability and repeatability. As a result, customers can capitalize on the common platform to maximize overall product longevity, utilization rates and test costs. Its simple configuration delivers broad application coverage and flexibility unattainable with other test systems, without compromising any functionality or performance.
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| MB AV8 - 500Msps AWG | By being a generation ahead in analog, the solution is equipped for today's and tomorrow's challenges: Economic flexibility through scalable number of cores (2s2m, 4s4m , 4s4m incl. 2x 500M AWG) Very high utilization through broad application coverage, such as: - Professional audio - Baseband IQ - Broadband Communications - ODD / DVD / Blu-Ray - Digital TV and more |
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| 100 Mbps entry level, scalable to 400 (533+) Mbps per pin 224 MVectors per pin (x4-mode) |
Scalability covers majority of test pins for consumer IC and wafer sort and majority of interfaces used for consumer ICs | |
| 64 channels per card | Greater overall flexibility by enabling more multi-site with up to 1024 channels in the Compact Test Head | |
| Highest performance VI for embedded DC | Provides the flexibility to address multiple applications (eFLASH, ePMIC, Reference) with a single card Scalable from 16 to 32 channels Pattern triggered per channel for highest throughput | |
| Pattern-triggered multi-channel DPS | 32 Channel per card for higher multi-site Multiple power domains Fast Synchronous triggering for improved repeatability and highest throughput |
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| V93000 Compact Test Head | The industry's most versatile zero-footprint test head because of: 18 slots Up to 1024 digital channels Up to 3.6Gbps with Pin Scale 3600 AV8, MBAV8, 6GQS Port Scale RF DC Scale VI32, DPS32 DPS (MS, Hi-C, Hi-V, Utility...) Shared Cooling Unit for 4 CTH 100% compatible DUT I/F to STH 9.5", 12" or 17" Wafer Probe I/F |
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| Ultra Fast upload/download | Improves OEE and throughput, especially embedded Memory | |
| SmarTest Release 6.1 | Accelerated debug with consolidation of today's SmarTest tools into an integrated open architecture Work Center | |
| SmarTest Release 6.2 | Accelerated yield ramp in manufacturing by simplified pin configuration and datalog setup and control |
Highest performance VI32 for embedded DC
Pattern triggered multi-channel DPS