High-End Consumer Mixed Signal

The V93000 Consumer Mixed Signal Test Solution is the best way to achieve low cost-of-test while accurately overcoming the unique mixed signal testing challenges of the latest consumer device SOCs.

The V93000 Consumer Mixed Signal Test Solution is tailored for semiconductor designers and high volume manufacturers who need to effectively and economically perform mixed signal tests across a broad range of highly integrated consumer applications, such as:

  • digital-dominant consumer SOC at package and wafer sort
  • consumer mixed signal devices such as ODD, DVD, DTV and STB
  • highly integrated devices, including ePMIC and eFlash

Using the most advanced test methods to ensure the highest accuracy and test quality, the solution achieves high single-site and multi-site throughput in both wafer sort and final test of highly integrated devices.

Other systems available in this space require multiple platforms and solutions, and sacrifice functionality to address value and cost requirements. In contrast, the V93000 Consumer Mixed Signal test solution leverages a single, scalable platform with proven stability, reliability and repeatability. As a result, customers can capitalize on the common platform to maximize overall product longevity, utilization rates and test costs. Its simple configuration delivers broad application coverage and flexibility unattainable with other test systems, without compromising any functionality or performance.




image of Consumer Mixed Signal
zoom Consumer Mixed Signal Cards
 Features & Benefits
 Key Specifications



Feature Benefit
MB AV8 - 500Msps AWG   By being a generation ahead in analog, the solution is equipped for today's and tomorrow's challenges:
Economic flexibility through scalable number of cores (2s2m, 4s4m , 4s4m incl. 2x 500M AWG)

Very high utilization through broad application coverage, such as:
- Professional audio
- Baseband IQ
- Broadband Communications
- ODD / DVD / Blu-Ray
- Digital TV and more
     
100 Mbps entry level, scalable to 400 (533+) Mbps per pin
224 MVectors per pin (x4-mode)
  Scalability covers majority of test pins for consumer IC and wafer sort and majority of interfaces used for consumer ICs
     
64 channels per card   Greater overall flexibility by enabling more multi-site with up to 1024 channels in the Compact Test Head
     
Highest performance VI for embedded DC   Provides the flexibility to address multiple applications (eFLASH, ePMIC, Reference) with a single card Scalable from 16 to 32 channels Pattern triggered per channel for highest throughput
     
Pattern-triggered multi-channel DPS   32 Channel per card for higher multi-site
Multiple power domains
Fast Synchronous triggering for improved repeatability and highest throughput
     
V93000 Compact Test Head   The industry's most versatile zero-footprint test head because of:
18 slots
Up to 1024 digital channels
Up to 3.6Gbps with Pin Scale 3600
AV8, MBAV8, 6GQS
Port Scale RF
DC Scale VI32, DPS32
DPS (MS, Hi-C, Hi-V, Utility...)
Shared Cooling Unit for 4 CTH
100% compatible DUT I/F to STH
9.5", 12" or 17" Wafer Probe I/F
     
Ultra Fast upload/download   Improves OEE and throughput, especially embedded Memory
     
SmarTest Release 6.1   Accelerated debug with consolidation of today's SmarTest tools into an integrated open architecture Work Center
     
SmarTest Release 6.2   Accelerated yield ramp in manufacturing by simplified pin configuration and datalog setup and control




Highest performance VI32 for embedded DC

  • 32 channels / card
  • +25V/200mA, +8V/500mA
  • Precision V/I Meas with 10nA,
  • +/-2mV accuracy (+/-200uV short-term)
  • Sequencer control
  • AWG and Digitizer
  • Post-processing units

Pattern triggered multi-channel DPS

  • 32 channels, 1.5A @ 3V (0.5A @ 7V)
  • Up to 32-channel ganging for higher current
  • Less than 60dBm noise floor
  • Fast IDDQ with local storage
  • Post-processing of samples (parallel)