The V93000 SOC Series tests the System-on-a-chip (SOC) and System-in-a-package (SIP) devices used in a very wide range of electronic products including MP3 players, digital televisions, television set-top boxes, PCs, gaming consoles and cell phones and other wireless communication devices.

Nanoelectronics Digital
The V93000 Nanoelectronics Digital Solution is a low-risk, economical test solution that accelerates time-to-market by targeting fail mechanisms that become business-critical at 65nm and smaller.

Port Scale RF
The Port Scale RF solution provides highest test efficiency and minimum cost-of-test, with up to 48 ports, true quad-site and high multi-site parallel efficiency.

High-End Consumer Mixed Signal
The V93000 High-End Consumer Mixed Signal Test Solution is the best way to achieve low cost-of-test while accurately overcoming the unique mixed signal testing challenges of the latest consumer device SOCs.

Yield Learning
On-tester capture and real-time statistical analysis of electrical failures on complex SOC product die, accelerating time to entitlement yield.

Silicon Debug
Rapidly detect, diagnose and visualize electrical failures on complex SOC devices shortening time to debug, ramp and volume production.

Platform, Cards, Components
The V93000 platform combines innovative tester-per-pin processor architecture with a comprehensive set of digital, analog, and power resources, along with productivity tools and software.