Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility.

Industry Challenges
The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Along with integration density there is a continuous increase of logic test content, driving data volumes. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. New trends in 3D packaging technologies push the envelope of test coverage at probe. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success.

The V93000 Versatile Digital Solution
The V93000 digital test solutions are based upon Advantest’s proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go.

With about 2500 systems installed worldwide, including 1500 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. The platform has become the all purpose reference platform.

Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet.

The uncompromised per-pin architecture of the V93000 resources as deployed in the Pin Scale 400, 800, 3600 cards results in a number of key benefits and assets for the “heavy digital” application domain:

• All per-pin DC resources leading maximum parallelism
• Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing
• Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions
• Versatility and scalability of power supply sources ranging from precision VI to 100’s of amps with per resource integrated measurement capability
• Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment
• Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin Scale HX

Full support of state of the art standards in automation:

• Fully standards compliant data import capability for leading industry formats, STIL, eVCD, WGL available off the shelf easing the integration into the customer specific environment provided by SmarTest Data Link
• STDF V5 compliant output formatting streamlines data communication to factory data bases
• Background data collection, e.g. fail mapping in the background, enables highest throughput in volume test and intensive data collection in one go

Integration into the debug and diagnostic loop:

• FaultInsyte, the Advantest debug package, enables debugging digital core design down to the chain or flop
• Back annotation allows to back trace and link fail information to design data base information to quickly resolve design flaws
• Yield Vision provides you viewing and analysis capability

Direct-probe interface solutions are available for the entire fleet of V93000 offerings.