As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test.
V93000 SOC Test Solution
The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SOC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF.

The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by:
Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level:

Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SOC for mobile phones.
