Press Release Archive



Advantest’s VOICE 2012 Semiconductor Test Conference Attracts Over 300 Attendees from Around the World
CUPERTINO, Calif. – May 10, 2012 – The 2012 edition of the VOICE annual Users Group Conference organized by premier semiconductor test company Advantest (NYSE: ATE) and a committee of partner companies, attracted over 300 SOC test engineers and managers from 41 companies to San Jose, California, on April 24-25.

ISE Labs Installs Verigy's V93000 Test Platforms at Facilities in Silicon Valley and Austin, Texas
CUPERTINO, Calif. - February 29, 2012 - Semiconductor test equipment supplier Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), today announced that ISE Labs has installed V93000 Smart Scale™ and Pin Scale Generation testers with Pin Scale digital channel cards at its testing and packaging facilities in Fremont, California, and Austin, Texas, extending the test-development services partnership between the two companies.

VOICE 2012 Conference Expands to Feature High Quality Presentations for Both the V93000 and T2000 Platforms
CUPERTINO, Calif. - February 2, 2012 - VOICE 2012, a users group meeting and partners conference organized by Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), will include an extensive strong technical program with papers from users of the V93000 and T2000 platforms.

Verigy, an Advantest Group Company, Earns Five Star Customer Satisfaction Award from VLSI Research for Third Consecutive Year
CUPERTINO, Calif. - January 24, 2012 - Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), has earned a Five Star Award for the third consecutive year in VLSIresearch's 2011 Customer Satisfaction Survey on Chip-Making Equipment.

Verigy, an Advantest Group Company, to Feature Keynote Address by Forward Thinker, Mitch Ditkoff, at VOICE 2012 User’s Group and Partner’s Conference
CUPERTINO, Calif. - January 19, 2012 – Semiconductor test equipment supplier Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), will feature a keynote presentation at VOICE 2012 by Mitch Ditkoff, an author, blogger and management consultant.

Call for Papers Issued for VOICE 2012 Technical Program on System-on-Chip Semiconductor Test Technologies
CUPERTINO, Calif. – Oct. 6, 2011 – An international call for papers focusing on innovative test solutions for system-on-chip (SOC) semiconductor devices has been issued for the technical program at VOICE 2012, a users group meeting and partners conference organized by Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE).

Verigy Wins Best Supplier Award from STATS ChipPAC for Fourth Year in a Row
CUPERTINO, Calif. – Sept. 29, 2011 – Semiconductor test equipment supplier Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), has received its fourth consecutive Best Supplier Award from Singapore-based STATS ChipPAC Ltd. (SGX-ST: STATSChP), a leading provider of semiconductor packaging design, assembly, test and distribution solutions. Verigy has won this honor each year since the award’s creation in 2007.

Verigy Marks 2,500th Shipment of V93000 SOC Test Platform with Multi-System Installation at ASE
CUPERTINO, Calif. – Sept. 1, 2011 – Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), has reached a major milestone with the installation of its 2,500th V93000 system-on-chip (SOC) test platform.

Verigy to Showcase New V93000 Smart Scale Test Platform and Present Technical Paper at SEMICON West 2011
CUPERTINO, Calif. – July 7, 2011 – Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE) and a global supplier of innovative test solutions, will showcase its newest technologies – including the industry’s first “smart” testers for the 28nm generation of devices – at the SEMICON West trade show, July 12-14 at the Moscone Convention Center in San Francisco.

Verigy Launches the Semiconductor Industry’s First Scalable Class of Testers – V93000 Smart Scale - to Lower the Cost of Test for Next-Generation ICs
CUPERTINO, Calif. – July 7, 2011 – Verigy, an Advantest Group company (TSE: 6857, NYSE: ATE), has announced the industry’s first series of scalable, highly cost-efficient tester classes for advanced semiconductor designs, including 3D device architectures and IC designs for the 28nm technology node and beyond.