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go/semi Newsletter

Verigy's go/semi newsletter is published monthly for test engineers, managers and executives focused on the high-volume manufacturing test floor. Find technical notes, test methodologies, Q&A, Verigy technology innovations, important upcoming events and news.

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Recent Issues of go/semi

January 2010	VOICE 2010; The Basics of Noise Figure Measurements for ATE; MTP: New Memory Test Solution Enabled by Software for True Per-pin Test Processor Architecture System; High Density RF Loadboard Design; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 21 - Trend Removal (Part 1); Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 21 - Trend Removal (Part 1); Press Releases and more.
February 2010	VOICE 2010; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 22 - Trend Removal (Part 2);Fundamentals of Vector Signal Analysis;Frequency/Phase Movement Analysis by Orthogonal Demodulation: Part 2 - PLL Lock-in Trend Analysisby RT-SPU Empowered Digitizer Press Releases and more.
November 2009	Frequency/Phase Movement Analysis by Orthogonal Demodulation; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 19 - ADC Histogram Linearity – Programming; Multi-Site P1dB Measurement using Swept Input Power Methodology on V93000 Port Scale RF; Press Releases and more.
October 2009	Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 18 - Histogram Method in ADC Linearity Test; RF Measurement Fundamentals; Press Releases and more.
September 2009	Technical Note: Solving MIPI D-PHY Transmitter Test Challenges; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 17 - Another Method in Signal to Noise Ratio Calculation; FAQ's, Press Releases and more.
August 2009	Technical Note: System Noise Consideration; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 16 - Moving Average; FAQ's, Press Releases and more.
July 2009	V101; Technical Note: Reducing the peak-to-peak variation of the noise floor with a pseudo video filter for the digitized data; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 15 - Filtering in Frequency Domain; FAQ's, Press Releases and more.
June 2009	Yield Learning Solution for the V93000; Technical Note: An Introduction to Scan Test for Test Engineers, Part 2; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 14 - Finite Impulse Response Filter; FAQ's, Press Releases and more.
May 2009	Technical Note: Fundamentals of DC Testing; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 13 - Inverse FFT; RF Lecture Series: Modulation Fundamentals - Introduction to WCDMA; FAQ's, Press Releases and more.
April 2009	Feature Article: Redefining Memory Test; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 12 - Spectrum Estimation
March 2009	Technical Note: An Introduction to Scan Test for Test Engineers; Introduction to FM-Stereo-RDS Modulation; Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 11 - Windowing; FAQ's, Press Releases and more.
February 2009	Technical Note: Group Delay Measurement, Mixed Signal Lecture Series: DSP-Based Testing Fundamentals - Under Sampling 3; RF Lecture Series: Modulation Fundamentals 7 - Introduction to 3GPP LTE; FAQ's, Press Releases and more.Technical Note: Group Delay Measurement, Mixed Signal Lecture Series: DSP-Based Testing Fundamentals - Under Sampling 3; RF Lecture Series: Modulation Fundamentals 7 - Introduction to 3GPP LTE; FAQ's, Press Releases and more.