Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 18 - Histogram Method in ADC Linearity Test
Linearity is the most important specification of A/D converters (ADC). There are several methods available to test linearity of ADC. Histogram analysis is quite simple and easy to apply so that it is one of the most typical test methodologies. It may be called as a code density test. Ramp histogram and sine histogram tests have been used for a long time; however, linearity calculation equations for ramp/sine histogram are not well organized. In this document, his-togram methods are discussed in detail, focusing on a terminal based (end-point) transfer function, easy-to-use equations are introduced with using cumulative distribution function for sine histogram. The method using this equation is free from overload level and offset of test signal sine so that test procedure is simple and fast in both hardware-wise and software-wise. 
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, 164 KBRF Measurement Fundamentals
Wireless SOC test is a very fast paced industry. The approaches used a few years ago for common measurements must constantly be changed and updated in order to meet today’s test requirements. As devices become more complex, the ability to make complex measurements is paramount to successfully bringing new products to market.
Equally important is test time. For bench setups, a 100ms measurement settling time, or a 50ms source seek time are perfectly acceptable. In test engineering, time is a very valuable commodity and delays such as these cannot be tolerated. Entirely new measurement approaches need to be exploited in order to get the same information about DUT performance in a fraction of the time for traditional methods.
This article is the first in a series of articles that will appear in the coming issues of go/semi. The goal of these articles will be to review some RF measurement fundamentals and to explore some of the latest findings and techniques used to achieve fast and reliable results with modern ATE systems., 22 KB.
Equally important is test time. For bench setups, a 100ms measurement settling time, or a 50ms source seek time are perfectly acceptable. In test engineering, time is a very valuable commodity and delays such as these cannot be tolerated. Entirely new measurement approaches need to be exploited in order to get the same information about DUT performance in a fraction of the time for traditional methods.
This article is the first in a series of articles that will appear in the coming issues of go/semi. The goal of these articles will be to review some RF measurement fundamentals and to explore some of the latest findings and techniques used to achieve fast and reliable results with modern ATE systems.
, 22 KB.News
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