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Technical Notes
A New And Innovative Way of Doing Resistance Measurements With V93000 HSM3G
"Inheriting and Overloading" Concept in Creating Reusable Universal Test Method Library
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 36: Filter Response Simulation by F-matrix
Feature Article
Visit Verigy at SEMICON West 2011, July 12-14, in San Francisco
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Technical Notes
A New And Innovative Way of Doing Resistance Measurements With V93000 HSM3G
Verigy's new High-Speed-Memory test system series provides plenty of new functionalities to address the requirements of today’s and the next generation memory devices. One of the new functionalities is the ability to perform pattern controlled DC value measurements in a fast manner. In this context, pattern controlled means synchronous and parallel execution on all device sites under test in a high volume manufacturing environment, as well as best flexibility and accuracy for any characterization task. This paper introduces the new concept of pattern controlled DC value measurements. It describes how to utilize the capabilities of the new High-Speed-Memory hardware generation based on a concrete DDR3 use case.  , 483 KB
"Inheriting and Overloading" Concept in Creating Reusable Universal Test Method Library
Test method is a critical software component in the V93000 test program. For a determined test condition and instrument, the test procedure, which is implemented with test method, is highly reusable. This article introduces how to build a reusable but customizable universal test method (UTM) library. , 801 KB
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 36: Filter Response Simulation by F-matrix
ADC and DAC are the most typical mixed signal devices. In mixed signal testing, analog stimulus signal is generated by an arbitrary waveform generator (AWG) that employs a D/A converter inside, and analog signal is measured by a digitizer or a sampler that employs an A/D converter inside. The stimulus signal is created with mathematical method, and the measured signal is processed with mathematical method, extracting various parameters. It is based on digital signal processing (DSP) so that our test methodologies are often called DSP-based testing.
Test/application engineers in the mixed signal field should have thorough knowledge about DSP-based testing. FFT (Fast Fourier Transform) is the most powerful tool here. This article will deliver a series of fundamental knowledge of DSP-based testing, especially FFT and its related topics. It will help test/application engineers comprehend what the DSP-based testing is and assorted techniques. , 337 KB
Feature Article
Visit Verigy at SEMICON West 2011, July 12-14, in San Francisco
Imagination, Inspiration and Innovation. Verigy’s Booth #6575 at SEMICON West in the Advanced Technology Manufacturing TechZONE in the North Hall of the Moscone Convention Center will be a hub of activity with demos, product announcements, technical presentations, and more! Learn how Verigy’s solutions help you to compress development time and increase yield, supporting faster time to market and lower production costs. Additional information is available on Verigy.com.
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Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.
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