Verigy Semiconductor Test Newsletter
March 2011
 
 
 


 

gosemi
 
       
 
A newsletter of relevant technical notes, test methodologies, innovations, events and news
 
 
       
   
 

Technical Notes
Method to Calculate Frequency Domain Parameters of the Non-coherent Waveform, Part 2

Test Methodologies
Mixed Signal Lecture Series:
DSP-Based Testing Fundamentals
34: Spread Spectrum Clock Generation by Three Methods

Feature Article
VOICE 2011 to Feature Keynote Address by Futurist Michael Rogers

News
Press Releases
 

 

V101

 

 

Find out more about Verigy's
products and solutions:

SoC/SiP
Design for Test/Yield

High Speed Memory
Memory
Low-cost ICs

 

 

Visit the go/semi web page for
past issues of go/semi.

This is your newsletter, so if
you have suggestions for
articles, new content or want
to give us feedback: contact us.

 

Technical Notes

Method to Calculate Frequency Domain Parameters of the Non-coherent Waveform, Part 2 
Frequency domain parameters like THD, SNR or SFDR are major parameters to evaluate waveform performance, especially for sine waveforms. To obtain the frequency domain parameters by using FFT, waveform measurements with a coherent condition are important. But in general waveform measurements, it often does not meet the coherent condition.

Part 1 described the window functions that are applied to obtain some frequency domain parameters with this non-coherent condition. But all of the correct frequency domain parameters can not be calculated even with the window function. There are several methods to provide all of the frequency domain parameters from the waveform measured in non-coherent conditions, but the results of these methods may not be correct enough at low noise level or large amplitude conditions.

This paper, Part 2 introduces the new method to provide correct frequency domain parameters in almost any conditions. pdf, 508 KB.
 

Test Methodologies
 

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 34: Spread Spectrum Clock Generation by Three Methods
Spread spectrum clocking (SSC) is getting implemented in high-speed serial data communication systems such as SATA (serial ATA) and USB3.0. Therefore, demand for testing SSC is getting popular. However, implementation of SSC is not an easy task for regular digital pin electronics; on the other hand, it is a piece of cake by using arbitrary waveform generators (AWG). The topic of the month is to make a program of SS clock by 3 approaches. pdf, 660 KB
.

Feature Article

Register Now!VOICE 2011 to Feature Keynote Address by Futurist Michael Rogers 
This year’s keynote address provides new and exciting information for everyone attending,” said Verigy’s Rich Lathrop, chairperson of the VOICE 2011 program committee. "Roger’s presentation will give an insight into what will be the next great thing and where the opportunities lie ahead. VOICE’s rich technical program, combined with this insightful presentation, will deliver an informative and stimulating event for our attendees."
 

Additional information is available on the all new VOICE 2011 Website.

VOICE 2011 Sponsors

News

Other

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.


 

 
       
     

Verigy

If you can't view this e-mail, please click here.

Privacy Officer, Verigy Ltd., 10100 N. Tantau Avenue, Cupertino, CA 95014

 

    VERIGY HOME | PRIVACY STATEMENT | TERMS OF USE VERIGY LTD. 2011