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Technical Notes
Accurate Harmonics Measurement by Sampler: Part 1
Auto-Z Test Cell Software Solution
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 37: F-matrix Simulation TDR
Feature Article
Join Verigy at SEMICON West 2011, July 12-14, in San
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Technical Notes
Accurate Harmonics Measurement by Sampler: Part 1
The Total Harmonic Distortion (THD) is one of the major frequency domain parameters for verifying dynamic linearity characteristics of devices like Analog to Digital Converters (ADC), Digital to Analog Converters (DAC), Amplifiers and so on. The measurement instrument to evaluate the harmonic distortion needs to have low harmonic distortion and wide bandwidth characteristics. In general, it is difficult to realize both characteristics in one instrument. This paper introduces the measurement conditions and the method to measure the correct harmonic distortions by the Sampler based on experiments.  , 381 KB
Auto-Z Test Cell Software
In the past year, the direct docking solution has been introduced for wafer sort (WS) testing to achieve better signal integrity, better coverage of testing in WS, and further reduce the cost of the signaling hardware. The direct docking solution requires very good quality of the prober setup especially for the over-drive (OD) and Z height setting. In the past, this setting was done manually and depends on the setup engineer’s experience, so the results can be inconsistent and also time-consuming to achieve the best setting. If the improper setting is applied, this will also impact the probe needle lifetime and might result in unacceptable probe mark on the pad, and even damage to the device under test (DUT).
To resolve these issues, Verigy has worked with our customers to introduce the Auto Z setup solution. This solution is currently operational in several foundry customers and we continue to enhance it with new features. This paper explains the needs and benefits to the industry of the Auto Z solution and the structure of the current solution on the V93000 with TEL prober, and how it operates. The paper will also cover the further enhancement on the Auto Z usage on the die based SPC to achieve the “Auto Z setup on the fly” concept that is not possible to do by manual setup. , 363 KB
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 37: F-matrix Simulation TDR
For quality test, an LSI tester must deliver the right signal to the device-under-test (DUT), requiring the tester’s pin driver to overcome the capacitance of the DUT input terminal. Although input capacitance is usually specified in the device specifications, it typically is not measured because the LSI tester is not equipped with the right instruments. The purpose of this report, and the research behind it, is to measure LCR on a device input using a waveform sampler.
The basic methodology is a traditional time-domain reflectometry (TDR) utilizing a clock supplied by a regular pin driver as the test signal. The signal path to the DUT is then monitored by connecting a simple resistive probe. This month’s article introduces the simulation result performed using the four-terminal matrix method introduced in the previous issue, which is simple and primitive but good enough for predicting distinctive waveforms on a transmission line. The actual measurement results will be reported in next month’s issue. , 415 KB
Feature Article
Join Verigy at SEMICON West 2011, July 12-14, in San Francisco
Verigy is a proud sponsor of SEMICON West 2011! Please plan to visit us at Booth #6575 in the Advanced Technology Manufacturing TechZONE in the North Hall of the Moscone Convention Center. We will showcase Verigy’s full range of productivity-enabling products including the V93000 Port Scale RF system, the V93000 HSM series, and the scalable V6000 system. Verigy will also feature Touchdown Technologies’ scalable, MEMS-based probe cards. Additionally, you won’t want to miss Stefan Walther’s presentation on “High-Efficiency & Accurate DC Measurements on Next-Generation Digital Cards” on Wednesday, July 13, from 4 p.m. to 4:30 p.m. Stefan is an R&D staff consultant for Verigy’s semiconductor test solutions and will present his paper during the trade show’s TechXPOT technical session on the TechSITEs stage in the North Hall of the Moscone Convention Center. Additional SEMICON West information is available on Verigy.com. We look forward to seeing you at the show.
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