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Top Stories
Verigy Becomes Wholly Owned Subsidiary of Advantest
Verigy Debuts New Logo
Verigy Launches the Semiconductor Industry’s First Scalable Class of Testers – V93000 Smart Scale – to Lower the Cost of Test for Next-Generation ICs
Technical Notes
New Features in V93000 WCDMA Demodulation
Precharging Makes DC-Scale Current Forcing More Active
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 38: TDR Experiment
Feature Article
Verigy Highlights Imagination, Inspiration and Innovation at SEMICON West 2011!
News
Press Releases
Introducing the V93000 Smart Scale Generation
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Top Stories
Verigy Becomes Wholly Owned Subsidiary of Advantest
On July 4, Verigy announced that Advantest Corporation completed its acquisition of Verigy in an all-cash transaction, estimated to be approximately $1.1 billion. Verigy is operating as a wholly owned subsidiary of Advantest and is known as an Advantest Group company. Jorge Titinger, Verigy’s president and CEO, continues to lead the organization in his current role, reporting to Haruo Matsuno, Advantest's president and CEO.
"As a combined company, we will offer the most innovative test solutions to cover all memory and SOC requirements, and these solutions will be backed by the largest and most experienced global sales and applications teams in our industry,” said Jorge Titinger, president and CEO, Verigy. “We will expand our already strong presence at leading IDMs, fabless companies, foundries and OSATs. Now, as part of Advantest, we expect to support a broader and deeper penetration of the combined company’s product portfolio. As a result, we intend to accelerate revenue growth and increase overall ATE market share. I look forward to working with the Advantest organization to build the number one global supplier of innovative test solutions."
Verigy Debuts New Logo
 As a wholly owned subsidiary of Advantest, Verigy will not change its name, however, we are now using a new logo that combines the existing Verigy logo, untouched, with the "Advantest Group" designation below it.
Over the next couple of months, you may also notice an interim Advantest-Verigy logo that was created especially to celebrate the announcement of the new combined company, but will eventually be phased out.
Verigy Launches the Semiconductor Industry’s First Scalable Class of Testers – V93000 Smart Scale – to Lower the Cost of Test for Next-Generation ICs
Verigy has introduced the industry's first series of scalable, highly cost-efficient tester classes for advanced semiconductor designs, including 3D device architectures and IC designs for the 28nm technology node and beyond. Fully compatible with Verigy’s production-proven V93000 platform, the Smart Scale series is an innovative "smart" generation of testers with advanced per-pin capabilities. Smart testing means that each pin can run with its own clock domain, providing full test coverage by matching the exact data rate requirements of the device under test. Coupled with other key features such as power supply modulation, jitter injection and protocol communication, system-like-stress test now can be performed at the ATE level, improving fault-model coverage.
"With our innovative V93000 Smart Scale Generation of test systems and pin cards, Verigy is pioneering smarter test methodologies that provide custom-fit solutions to reduce our customers' cost of test," said Hans-Juergen Wagner, executive vice president of SOC test at Verigy, an Advantest Group company.
Learn more about V93000 Smart Scale at www.verigy.com/go/SmartScale and be sure to view the new Smart Scale product video.
Technical Notes
New Features in V93000 WCDMA Demodulation
This paper presents an overview of some of the new features pertaining to WCDMA found in the Verigy Demodulation Library. These can improve test times and TTM (Time To Market) by allowing users to select demodulation results for either a specific, or multiple WCDMA slots. Code examples are also provided.  , 61 KB
Precharging Makes DC-Scale Current Forcing More Active
When doing IFVM (current forcing voltage measure) mode, most tester instruments, including DC-Scale, need to define v-clamp to determine the current direction. But for some PMIC tests with special design (i.e., LDO and BUCK with Over-Current-Protection), the clamp voltage used for current direction normally will shutdown or even “kill” the device. Setting an appropriate v-clamp value when forcing current becomes a real headache and a difficult thing since a little higher or lower value will make the device into an unexpected status. This paper introduces a method using precharging before current forcing to solve this challenge. , 69 KB
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 38: TDR Experiment
Last month, we described the TDR simulation performed using the four-terminal matrix method. This month’s article reports actual measurement results compared to the simulation results. , 1.5 MB
Feature Article
Verigy Highlights Imagination, Inspiration and Innovation at SEMICON West 2011!
From the creative "Imagination, Inspiration. Innovation." theme and graphics at the Verigy booth, to the new V93000 Smart Scale Generation introduction and the joint activities with Advantest, Verigy had a strong showing at SEMICON West 2011.
Only eight days before SEMICON West, on July 4, Verigy announced that Advantest Corporation had completed its acquisition of Verigy. This year's show was the perfect opportunity to talk more about the combination of the two companies and celebrate the completion of the acquisition, including a press conference on July 12, multiple joint meetings, and two customer events. The Advantest-Verigy logo was also prominently displayed at both the Advantest and Verigy booths.
Verigy launched the new V93000 Smart Scale Generation leading up to the show and highlighted four other products during the show:
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NEW V93000 Smart Scale Generation, the industry’s first series of scalable, highly cost-efficient tester classes for advanced semiconductor designs.
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The V93000 HSM series, built on a scalable, multi-generation test platform that fulfills the performance, functionality and economical requirements for testing all available high-speed memory technologies.
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The V93000 Port Scale RF system for testing wireless communication ICs for applications such as WLAN, GPS and Bluetooth devices.
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Touchdown Technologies' scalable, MEMS-based probe cards for single-touchdown testing of wafers up to 300mm.
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The scalable V6000 system that delivers low cost-of-test, high parallelism and high yields for final testing of both Flash and DRAM devices
In addition, Stefan Walther, R&D staff consultant for Verigy's semiconductor test solutions, presented a paper on "High-Efficiency & Accurate DC Measurements on Next-Generation Digital Cards" during the show's Test in Transition TechXPOT technical session. Verigy was also well-represented at ATE Vision.
Be sure to check out our Facebook page to see photos of Verigy at SEMICON West.
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Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.
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