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Top Stories
Verigy Earns Five Star Customer Satisfaction Rating for Third Consecutive Year
VOICE 2012: Keynote Mitch Ditkoff Stimulates the Creative Mind
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 43: Jitter Estimation from Phase Noise Data
Feature Articles
SEMICON Japan 2011 Marks First Joint Trade Show Appearance for Advantest and Verigy
Best Wishes for a Happy New Year from Verigy
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Top Stories
Verigy has earned a Five Star Award for the third consecutive year in VLSIresearch's 2011 Customer Satisfaction Survey on Chip-Making Equipment. Verigy is also once again the only SOC and memory test equipment provider among the 14 semiconductor equipment companies to win a Five Star Award this year. The VLSIresearch annual Customer Satisfaction Survey on Chip Making Equipment is the only publicly available opportunity for chip manufacturers to provide feedback on their suppliers since 1988. VLSIresearch received feedback from more than 550 organizations worldwide for this year's Survey. The five star suppliers garnered the highest ratings from customers and performed exceptionally across all rating categories in cost of ownership, quality of results, product performance, customer service, technical leadership, and commitment. Advantest and Advantest Group companies have received the Five Star Award eight times since the star-rating system began in 2005.
Verigy will feature a keynote presentation at VOICE 2012 by Mitch Ditkoff, an author, blogger and management consultant. A frequent keynote and large group workshop facilitator, Ditkoff has been an adjunct faculty member for several esteemed leadership development programs, including GE's Crotonville Management Development Center and Duke Corporate Education. Ditkoff has worked with a wide variety of Fortune 500 and mid-sized companies that have realized the need to do something different in order to succeed in today's rapidly changing marketplace. In 2010, he was voted as the #1 innovation blogger in the world, and Ditkoff's widely read blog, The Heart of Innovation, is a daily destination for a global audience of "movers and shakers."
Ditkoff’s keynote, titled "Catalyzing the Creative Mind," will kick off the VOICE users group and partners conference, scheduled for April 24-25 in San Jose, California. Ditkoff's keynote will touch on ways to activate, accelerate, and apply innate creativity on the job to be better able to solve old problems in new ways, to be more productive, to go beyond old assumptions and generate powerful new ideas to grow business. Ditkoff's engaging, interactive presentation is designed to inspire, build awareness, spark creativity, generate ideas and teach powerful techniques that can be applied on the job.
Additionally, the early registration deadline for VOICE has been extended to March 18, 2012. Don’t miss your chance to register early before the 20% discounted pricing goes away! You also save 20% when you register early for the April 26 Workshop Day, which features workshops that offer in-depth technical information and invaluable hands-on training. REGISTER NOW!
Visit the VOICE website for all the latest VOICE 2012 information.
Test Methodologies
ADC and DAC are the most typical mixed signal devices. In mixed signal testing, analog stimulus signal is generated by an arbitrary waveform generator (AWG), which employs a D/A converter inside, and analog signal is measured by a digitizer or a sampler, which employs an A/D converter inside. The stimulus signal is created with mathematical method, and the measured signal is processed with mathematical method, extracting various parameters. It is based on digital signal processing (DSP) so that our test methodologies are often called DSP-based testing.
Test/application engineers in the mixed signal field should have thorough knowledge about DSP-based testing. This series of articles delivers fundamental knowledge of DSP-based testing. This month’s article discusses how to estimate jitter from phase noise data.  , 252 KB
Feature Articles
Advantest and Verigy had a strong showing at SEMICON Japan Dec. 7-9, which marked the first joint trade show appearance for the two companies. Under the theme, “From Fusion Comes Power,” the Advantest-Verigy exhibit included a slate of test solutions and products representing capabilities from both portfolios. The show also provided the opportunity to emphasize the broadened test solution portfolio and increased technical and sales power made possible by the Advantest and Verigy integration. In addition, Advantest sponsored a Technical College support program, which is held by 10 companies in the semiconductor industry every year and gave the students (from Tokyo National Collage of Technology) the opportunity to present their studies on ventilation by using oscillating flow.
Click here to learn more about the products highlighted at SEMICON Japan and be sure to check out our Facebook page to see photos from the show.
Advantest and Verigy will also participate in the upcoming SEMICON Korea (Feb. 7-9 in Seoul) and SEMICON China (March 20-22 in Shanghai). We hope to see you there!
With this first go/semi issue of 2012, the Verigy team wants to thank our customers and partners for your support during 2011. Your business and partnership is very important to us and we wish you a successful and prosperous new year. We look forward to working with you throughout 2012!
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