Group Delay Measurement
The group delay characteristic (group delay vs. frequency curve) can be used to evaluate the phase-frequency response of devices. The most typical device is filters. This note describes how to measure the group delay characteristic, including a measurement technique and easy calculation method on the measurement results.
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 10 - Under Sampling 3
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 10 - Under Sampling 3
The fundamentals of under-sampling were discussed in a previous article, and the practical conditioning strategy for waveform analyses were discussed in last month's go/semi. In this month's article, the spectrum analyses are discussed.
RF Lecture Series: Modulation Fundamentals 7 - Introduction to 3GPP LTE
The 3rd Generation Partnership Project (3GPP) began a project in November 2004 to determine the long-term evolution of Universal Mobile Telecommunication System (UMTS) cellular technology. The specifications related to this effort are formally known as the evolved UMTS terrestrial radio access (E-UTRA) and evolved UMTS terrestrial radio access network (E-UTRAN), but are more commonly referred to by the project name LTE. This paper is intended to make the reader familiar with the physical layer, both structure and fundamentals, of LTE.
RF Lecture Series: Modulation Fundamentals 7 - Introduction to 3GPP LTE
The 3rd Generation Partnership Project (3GPP) began a project in November 2004 to determine the long-term evolution of Universal Mobile Telecommunication System (UMTS) cellular technology. The specifications related to this effort are formally known as the evolved UMTS terrestrial radio access (E-UTRA) and evolved UMTS terrestrial radio access network (E-UTRAN), but are more commonly referred to by the project name LTE. This paper is intended to make the reader familiar with the physical layer, both structure and fundamentals, of LTE.
Q&A
Question: "There are several ways to calculate Integral Non-Linearity (INL); would you please explain the different methods?
I am currently programming the DAC test program and heard there are several ways to calculate Integral Non-Linearity (INL); would you please explain the different methods?
News
Verigy Announces Financial Results for First Quarter 2009
Verigy to Present at the Goldman Sachs Technology and Internet Conference
Verigy Lowers Revenue Guidance and Announces Earnings Date and Conference Call for First Quarter of Fiscal 2009
Other
Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.
To unsubscribe and stop receiving go/semi, please click here.
If you can't view this e-mail, please click here.
Privacy Officer, Verigy Ltd., 10100 N. Tantau Avenue, Cupertino, CA 95014
If you can't view this e-mail, please click here.
Privacy Officer, Verigy Ltd., 10100 N. Tantau Avenue, Cupertino, CA 95014
