Verigy Semiconductor Test Newsletter
February 2011
 
 
 


 


 
       
 
A newsletter of relevant technical notes, test methodologies, innovations, events and news
 
 
       
   
 

Technical Notes
Efficient Test Program Development with STDL and STPM

C++ Tips, Part 3

Flexible Test Cell Controller Architecture

Test Methodologies
Mixed Signal Lecture Series:
DSP-Based Testing Fundamentals
33: Interpolation

Feature Article
VOICE 2011: Early Registration has been extended

News
Press Releases
 

 

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Technical Notes

Efficient Test Program Development with STDL and STPM
Verigy's software packages "SmarTest Data Link" (STDL) and "SmarTest Program Manager" (STPM) have been designed to generate initial test program setups for the V93000. Then SmarTest is used to debug the test program with devices.

STDL and STPM facilitate a simpler and more efficient development of an initial test program based on some new and unique features; for example, the capability to define safe settings for pins, automated integration of new test suites including reuse/merge of primaries, and a set of rules that gives the user control over the automated process.

This paper introduces the new concepts and features of STDL and STPM. It describes how to utilize the capabilities of the software packages, and how to set up the test program development flow in a structured way, so that the required time and effort is considerably reduced.
pdf, 168 KB.
 

C++ Tips, Part 3
In this article, taking vector as an example, we will take a glance of how to utilize containers with assistance of iterators and algorithms in C++. With these examples, distinguishing features of C++ are introduced.
pdf, 26 KB.

Flexible Test Cell Controller Architecture
Information is the lifeblood necessary to improve operations and performance at any level. As the semiconductor test industry matures it is implementing more advanced solutions to optimize business results. An emerging category of solutions targeted at Automatic Detection and Prevention of poor or non-compliant performance are built upon a rich set of data and control form the test cell. Critical insights are obtained from the synchronization and collection of manufacturing events, equipment events and product measurement data simultaneously.

This places increasing demands on the test cell controller to perform tasks that it was not originally designed for. New control sources, data sources, and monitoring systems are being added to the Test Cell at an increasing rate. The test system and the test cell control software must be flexible enough to coordinate and accommodate the data, monitor, and control requirements of each of these external systems. In order to support this interaction and to coordinate sometimes incompatible systems interfaces, a flexible, dynamic state engine driven control, and monitor capability is essential. Such an architecture will enable the test floor to adopt new optimization techniques incrementally without the need to replace their existing systems and infrastructure.
pdf, 227 KB.

Test Methodologies
 

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 33: Interpolation
Data handled in DSP based testing is discrete data so that there is no data between adjacent data points. If you need to change the sampling rate of a waveform provided for an AWG, you may want to interpolate adjacent data points and create new data. For example, when the test signal waveform is automatically generated by a simulator and a specific sampling rate is already specified strictly, but the specified sampling rate or the data size is not suitable for your AWG on hand, you need to convert the waveform data for appropriate sampling rate and size. Then the original waveform is interpolated and re-sampled by a different sampling rate. This is the topic of this article. pdf, 7.5 MB
.

Feature Article

Regiter Now!VOICE 2011: Early Registration Has Been Extended!
Registering for VOICE 2011 gets you into all events during the first two days of the conference, including all technical presentations, expert discussions, keynote addresses, the Suppliers Expo, and the evening event on April 19th.
 

Save Money and Be Eligible to Win Great Prizes
Early registration, which is $400, saves you $50 off the $450 registration fee at the door. When you register for VOICE on or before March 11, 2011, you become one of three registrants eligible to win an exciting gift like a Kindle or a gift certificate for a once-in-a-lifetime Redwood Adventure. Presenters, who register on or before March 11, 2011, pay $200 to attend and are eligible for the drawing. After this date presenters will pay the full registration fee of $400.

Additional information is available on the all new VOICE 2011 Website.

News

Other

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.


 

 
       
     

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