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Redefining Memory Test
Memory device markets are more uncertain today than perhaps they have been in their entire history. In manufacturing, uncertainty can be addressed by equipment that can scale to needs and is flexible to adapt to changes in products. In the memory test business, uncertainty can take the form of changing pin-counts; test strategies such as wafer sort, known good die (KGD), and core final test; and even device technology including DRAM, flash, and multichip packages (MCPs). Read full article. PDF, 878 KB. Chinese version available. |
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Verigy Semiconductor Test Newsletter
April 2009
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Technical Notes
Redefining Memory Test
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 12 - Spectrum Estimation
RF Lecture Series: Modulation Fundamentals - Introduction to TD-SCDMA
Find out more about Verigy's products and solutions:
SoC/SiP
Design for Test/Yield
High Speed Memory
Memory
Visit the go/semi web page for past issues of go/semi.
This is your newsletter, so if you have suggestions for articles, new content, or want to give us feedback contact us.
Redefining Memory Test
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 12 - Spectrum Estimation
RF Lecture Series: Modulation Fundamentals - Introduction to TD-SCDMA
Find out more about Verigy's products and solutions:
SoC/SiP
Design for Test/Yield
High Speed Memory
Memory
Visit the go/semi web page for past issues of go/semi.
This is your newsletter, so if you have suggestions for articles, new content, or want to give us feedback contact us.
Feature Article
Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 12 - Spectrum Estimation
In a previous go/semi article, windowing was discussed for coping with the situation that the measurement period does not contain an integer number of signal cycles. Two windows were introduced. FLAT_TOP window is useful and accurate in regular amplitude estimation without any special data manipulation. HANNING window may be less popular than FLAT_TOP in gen-eral. However, there is a remarkably marvelous application available with HANNING window. It was developed and reported by Dr. Tabei and Dr. Ueda in 1987. In this article, the author is going to digest the core part of the original paper, and show how to deploy it in a practical procedure. Read full article. PDF, 1 MB
RF Lecture Series: Modulation Fundamentals - Introduction to TD-SCDMA
TD-SCDMA, or Time Division-Synchronous Code Division Multiple Access, is a 3G mobile telecommunications standard, being developed initially for People’s Republic of China. It has been adopted by ITU and by 3GPP as part of UMTS Release 4, and is hence becoming a global standard. At the point of writing, this standard is relatively new. This paper intends to provide the basis of demodulating TD-SCDMA waveform for a successful EVM testing. It will first discuss the basics of the TD-SCDMA modulation to give the reader an idea of how the waveforms are created before dwelling on the mechanics of demodulating the signal. Read full article. 134 KB.
Other
Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.
RF Lecture Series: Modulation Fundamentals - Introduction to TD-SCDMA
TD-SCDMA, or Time Division-Synchronous Code Division Multiple Access, is a 3G mobile telecommunications standard, being developed initially for People’s Republic of China. It has been adopted by ITU and by 3GPP as part of UMTS Release 4, and is hence becoming a global standard. At the point of writing, this standard is relatively new. This paper intends to provide the basis of demodulating TD-SCDMA waveform for a successful EVM testing. It will first discuss the basics of the TD-SCDMA modulation to give the reader an idea of how the waveforms are created before dwelling on the mechanics of demodulating the signal. Read full article. 134 KB.
Other
Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.
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