Verigy Semiconductor Test Newsletter

April 2011
Verigy Go/Semi April 2011
 
 
A newsletter of relevant technical notes, test methodologies, innovations, events and news
 
 
 
         
 

Technical Notes
Advanced File Handling Techniques for Complex Waveform Analysis

C++ Tips, Part 4

Test Methodologies
Mixed Signal Lecture Series: DSP-Based Testing

Feature Article
VOICE 2011: A Huge Success

News
Press Releases
 

 

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Technical Notes

Advanced File Handling Techniques for Complex Waveform Analysis
It is easy during application development and debug to become sidetracked with managing how to save and view multiple complex array files. Reading and writing files and handling multiple file formats with C++ can be time consuming, and error prone. SmarTest API's can make file handling much easier. The Signal Analyzer tool has new API’s to make displaying arrays easier as well. This paper demonstrates some of the new API's introduced in SmarTest that make file handing and graphical array debug much more efficient and convenient. pdf, 234 KB
 

C++ Tips, Part 4
In the previous article, we used "vector" and its iterators along with algorithms to introduce powerful features of C++. This time we will use another C++ container, "map", to look further into capabilities of C++. pdf, 19 KB
 

Test Methodologies

Mixed Signal Lecture Series: DSP-Based Testing – Fundamentals 35: F-matrix Simulation
When you design a DUT board, you may want to analyze the characteristics and performance of transmission lines, switches, filters or their combination circuits. If you had simulation tools such as Spice or MATLAB available in your environment, you could use them for analysis. However, even if you have nothing like those tools, you could do considerable analysis utilizing our SmarTest environment. You might have learned about F-matrix in the lectures of electric circuit theory in your school days. It is very traditional and conventional theory. Many of you may have forgotten it. However, we could utilize it for our simple circuit simulations using our SmarTest APIs and arithmetic instructions. This scheme could be embedded in our application if necessary. From this month, we will discuss the F-matrix applications. pdf, 278 KB

Feature Article

VOICE 2011: A Huge Success
VOICE 2011 was a huge success with papers, presentations, workshops, and advanced discussion groups in topics covering loadboard design and new Verigy hardware; test techniques and methodologies; test engineering effectiveness; and cost-effective solutions for production test. Thanks to all who attended!

If you were not able to attend the event but would like a copy of the proceedings, you can place an order here. For $50, you will receive a USB stick with all the presentations, some supporting material, and a copy of the program guide.

For more information about VOICE and to see photos of the event, go to our Facebook page: VOICE User Group. Additional VOICE highlights are available on Twitter @VoiceUG.

We look forward to seeing you at VOICE 2012!

Special thanks to our VOICE 2011 sponsors:

VOICE 2011 Sponsors

News

Other

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.

 

 
       
     

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