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Innovation & Technology
Our scalable platforms deliver the competitive edge.
Our scalable platforms deliver the competitive edge.
Verigy's culture of innovation generates technology-leading products that help our customers to achieve a faster time-to-market and cost-competitiveness. The key benefits include:
Verigy's scalable platform architecture is enabling our semiconductor customers to deliver new features, better performance, and ever-lower price points. We offer testing solutions for two general device categories:
Our V93000 platform is made more scalable by its "tester-per-pin" architecture, which enables independent testing of each device pin. The design also supports rapid configuration changes, making it well suited for testing a wide range of products.
"Tester-per-site" architecture
Our V5000 platform is made more scalable by its "tester-per-site" architecture, which enables highly parallel and efficient testing. The design also supports independent control of each device under test, resulting in greater tester utilization and a significantly lower cost of final test.
ASIC-based test processor
Both platforms benefit from greater scalability, flexibility, performance, and accuracy by using an ASIC-based test processor at each test site. This enables a large number of devices to be tested in parallel within a test system that's smaller than ever. With a separate and independent test processor at each site, the speed of the test can stay the same, even when sites are added for additional parallel testing.
Liquid cooling
Heat can be an issue when testing high-performance products. Our liquid cooling technology provides lower operating temperatures, greater system reliability, reduced operating costs, improved accuracy and speed, and quieter and cooler operation than the traditional air-cooling used in many of our competitors' products.
Programmable Interface Matrix
Our optional Programmable Interface Matrix helps further boost the parallelism of our V5500 system for high-volume production testing of packaged devices. Much like a telephone switching system routes callers to their destinations, our technology routes testing resources to the device under test. The switching is purely electronic, resulting in faster and more reliable resource switching than mechanical relays, with less downtime. Plus, its extremely high pin count ensures that even highly complex memory devices can be tested with high parallelism and thus, at lower cost.
Do you have an innovation story using Verigy's test solutions?
Please share it with us!
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Scalability across different frequency ranges, pin counts, and numbers of devices.
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Flexibility for testing a wide range of applications for semiconductor devices.
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Advanced, innovative test technology, spanning the device categories for memory tests.
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Versatility for shortened time to market and lower overall cost of test.
Verigy's scalable platform architecture is enabling our semiconductor customers to deliver new features, better performance, and ever-lower price points. We offer testing solutions for two general device categories:
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The V93000 platform is designed for testing System-on-a-Chip (SOC), System-in-a-Package (SIP), and high-speed memory devices.
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The V6000 platform supports end-to-end testing of memory devices, including flash memory and multi-chip packages (MCPs).
Our V93000 platform is made more scalable by its "tester-per-pin" architecture, which enables independent testing of each device pin. The design also supports rapid configuration changes, making it well suited for testing a wide range of products.
"Tester-per-site" architecture
Our V5000 platform is made more scalable by its "tester-per-site" architecture, which enables highly parallel and efficient testing. The design also supports independent control of each device under test, resulting in greater tester utilization and a significantly lower cost of final test.
ASIC-based test processor
Both platforms benefit from greater scalability, flexibility, performance, and accuracy by using an ASIC-based test processor at each test site. This enables a large number of devices to be tested in parallel within a test system that's smaller than ever. With a separate and independent test processor at each site, the speed of the test can stay the same, even when sites are added for additional parallel testing.
Liquid cooling
Heat can be an issue when testing high-performance products. Our liquid cooling technology provides lower operating temperatures, greater system reliability, reduced operating costs, improved accuracy and speed, and quieter and cooler operation than the traditional air-cooling used in many of our competitors' products.
Programmable Interface Matrix
Our optional Programmable Interface Matrix helps further boost the parallelism of our V5500 system for high-volume production testing of packaged devices. Much like a telephone switching system routes callers to their destinations, our technology routes testing resources to the device under test. The switching is purely electronic, resulting in faster and more reliable resource switching than mechanical relays, with less downtime. Plus, its extremely high pin count ensures that even highly complex memory devices can be tested with high parallelism and thus, at lower cost.
Do you have an innovation story using Verigy's test solutions?
Please share it with us!
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